ZhETF, Vol. 95,
No. 1,
p. 183 (January 1989)
(English translation - JETP,
Vol. 68,
No. 1,
p. 104,
January 1989
)
The issue content is only available in english translation.
Temperature dependence of conduction by reconstructed dislocations in silicon and nonlinear effects
V.V. Kveder, A.E. Koshelev, T.R. Mchelidze, Yu. A. Osip'yan, A.I. Shalynin
Received: May 6, 1988
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