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JETP, Vol. 68, No. 1, p. 104 (January 1989)
(Russian original - ZhETF, Vol. 95, No. 1, p. 183, January 1989 )

Temperature dependence of conduction by reconstructed dislocations in silicon and nonlinear effects
V.V. Kveder, A.E. Koshelev, T.R. Mchelidze, Yu. A. Osip'yan, A.I. Shalynin

Received: May 6, 1988

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