JETP, Vol. 68,
No. 1,
p. 104 (January 1989)
(Russian original - ZhETF,
Vol. 95,
No. 1,
p. 183,
January 1989
)
Temperature dependence of conduction by reconstructed dislocations in silicon and nonlinear effects
V.V. Kveder, A.E. Koshelev, T.R. Mchelidze, Yu. A. Osip'yan, A.I. Shalynin
Received: May 6, 1988
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