ZhETF, Vol. 67,
No. 3,
p. 1148 (February 1975)
(English translation - JETP,
Vol. 40,
No. 3,
p. 570,
February 1975
)
The issue content is only available in english translation.
Investigation of the nature of the diode effect on dislocations in silicon
V.G. Eremenko, V.I. Nikitenko, E.B. Yakimov
Received: April 9, 1974
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