JETP, Vol. 40,
No. 3,
p. 570 (February 1975)
(Russian original - ZhETF,
Vol. 67,
No. 3,
p. 1148,
February 1975
)
Investigation of the nature of the diode effect on dislocations in silicon
V.G. Eremenko, V.I. Nikitenko, E.B. Yakimov
Received: April 9, 1974
|
|
Golden Pages
PDF (376.4K)