ZhETF, Vol. 80,
No. 3,
p. 1206 (March 1981)
(English translation - JETP,
Vol. 53,
No. 3,
p. 618,
March 1981
)
The issue content is only available in english translation.
Investigation of dislocations in silicon by the photo-ESR method
V.V. Kveder, Yu. A. Osip'yan
Received: July 31, 1980
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