ZhETF, Vol. 66,
No. 4,
p. 1469 (October 1974)
(English translation - JETP,
Vol. 39,
No. 4,
p. 721,
October 1974
)
The issue content is only available in english translation.
lnvestigation of the properties of the dislocation EPR spectra in silicon
S.V. Broude, V.A. Grazhulis, V.V. Kveder, Yu. A. Osip'yan
Received: November 25, 1973
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