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ZhETF, Vol. 104, No. 5, p. 3897 (November 1993)
(English translation - JETP, Vol. 77, No. 5, p. 874, November 1993 )

Effect of resonant tunneling and Coulomb repulsion of electrons in localized states on the current-voltage characteristics of NIN, SIN, and SIS tunnel structures
I.A. Devyatov, M. Yu. Kupriyanov

Received: May 21, 1993

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