ZhETF, Vol. 104,
No. 5,
p. 3897 (November 1993)
(English translation - JETP,
Vol. 77,
No. 5,
p. 874,
November 1993
)
Effect of resonant tunneling and Coulomb repulsion of electrons in localized states on the current-voltage characteristics of NIN, SIN, and SIS tunnel structures
I.A. Devyatov, M. Yu. Kupriyanov
Received: May 21, 1993
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