
JETP, Vol. 81,
No. 6,
p. 1208 (December 1995)
(Russian original - ZhETF,
Vol. 108,
No. 6,
p. 2216,
December 1995
)
Electronic structure of amorphous SiO2: Experiment and numerical simulation
V.A. Gritsenko, R.M. Ivanov, Yu. N. Morokov
Received: June 13, 1995
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