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JETP, Vol. 81, No. 6, p. 1208 (December 1995)
(Russian original - ZhETF, Vol. 108, No. 6, p. 2216, December 1995 )

Electronic structure of amorphous SiO2: Experiment and numerical simulation
V.A. Gritsenko, R.M. Ivanov, Yu. N. Morokov

Received: June 13, 1995

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